Electron energy loss near supported particles

Electron energy-loss spectrum-imaging

Electron energy-loss spectroscopy (EELS) in the scanning transmission electron microscope (STEM) is a powerful method for analyzing elemental, chemical, dielectric, and other information. The technique can be extended to produce quantitative images useful for interpreting the spatial distribution of this information. This paper describes an implementation of a new method of quantitative mapping...

SiO 2 − supported Pt particles studied by electron microscopy

Regularly grown Pt particles supported by amorphous SiO 2 were heated in hydrogen at 873 K after an oxidising treatment. The morphological and structural changes were studied by electron microscopy. Platinum silicides Pt 3Si with L12 (Cu3Au) structure, monoclinic Pt3Si and tetragonal Pt12Si5 were identified after the treatment. The mechanisms of coalescence of the particles and the formation of...

Energy Loss in Matter by Heavy Particles

Electron-energy-loss scattering near a single misfit dislocation at the GaAs/GaInAs interface.

Spatially resolved electron-energy-loss scattering has been used to study changes in the inelastic scattering near the bulk band-gap energy for locations near the GaAs-Ga0. 85Ino. [5As interface. %e observe the expected bulk band gap on either side of the interface. At a single interface-misfit dislocation we observe scatterIng which is consistent with an excitation of transitions between a loc...

Electron energy loss spectra near structural defects in TiN and TiC.

In this study, we use first principles multiple scattering calculations on atomic clusters to show how the carbon and nitrogen K-edge fine structures are modified in the vicinity of structural defects in TiN and TiC. Changes in the electron energy loss spectra are due to changes in the atomic structure of the first atomic shells around the absorbing atom. Two different kinds of defects, which b...